EAG offers two methods for evaluating PV Si feedstock in support of R&D, manufacturing, or for 3rd party verification of material:
1. Glow Discharge Mass Spectrometry (GDMS). This provides a survey of most elements in the periodic table and has detection limits that are useful for upgraded metallurgical grade silicon analysis. An international test method, SEMI PV1-0309, for the GDMS measurement of PV materials has been approved by the SEMI PV Committee.
2. Secondary Ion Mass Spectrometry (SIMS). This provides better detection limits, precision and accuracy than GDMS, but is too time consuming for a survey of the periodic table. SIMS is best used for critical elements, such as, B, P, Al, O, C, N, and Fe in gaseous-deposited PV Si feedstock.
These methods can be applied directly to Si produced by gaseous deposition methods (Siemens or modified Siemens process) or to Si produced by thermo-mechanical processing of metallurgical grade Si.
Further information is available here.