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Basler’s Sensic Thin-Film Inspection is designed for final inspection of thin-film solar modules after the Lamination step. It not only tests the lamination in peripheral and photoactive areas for bubbles and other defects, but also checks that bus bars are in place and correctly positioned.
Basler’s Sensic Thin-Film Inspection for coated glass is designed to monitor semi-conductor coatings inline in solar thin-film production. Both the number of pinholes in the coating and their distribution are determined. A special illumination technique allows the separation of partial and through pinholes.
The purpose of Basler’s Sensic Thin-Film Inspection for bare glass is to inspect front glass or back glass in a thin-film production line. Not only is incoming glass subjected to quality control but also the cleaning process is monitored. Glass defects, edge defects and defects in the etched TCO coatings are detected reliably.