LayTec offers compound semiconductor process monitoring instrumentation, especially for LED production. Additionally, we offer advanced in-line metrology, designed and optimized for large-area deposition techniques such as amorphous, polycrystalline and organic thin-films. LayTec early recognized a strong potential of its in-line metrology products among CIGS- and CdTe-based solar cell producers. The properties and thickness of all thin-film PV layers – TCO, absorber, and buffer layers – can be detected. But LayTec’s advanced optical in-line metrology finds its applications in a much wider range of thin-film processes depositing nano-scaled inorganic or organic layers on smooth or textured substrates.



Solar Media